- Variable Temperature UHV Scanning Probe Microscope AFM/STM (RHK UHV-3500). The microscope is equipped with e-beam evaporation system, variable temperature LEED-Auger, RGA, and other auxiliary tools that facilitate sample preparation and control under UHV environment. The system is installed in an STC-50 rated acoustic chamber.
- Bruker Multimode 8 ambient AFM/STM/EC-AFM/EC-STM microscope in acoustic chamber. We have an option to introduce the microscope in a controlled atmosphere environment (glove box) for studies in controlled atmosphere environment.
