Scanning Probe Microscopy
- Variable Temperature UHV Scanning Probe Microscope AFM/STM (RHK UHV-3500). The microscope is equipped with e-beam evaporation system, variable temperature LEED-Auger, RGA, and other auxiliary tools that facilitate sample preparation and control under UHV environment. The system is installed in an STC-50 rated acoustic chamber.
- Bruker Multimode 8 ambient AFM/STM/EC-AFM/EC-STM microscope in acoustic chamber. We have an option to introduce the microscope in a controlled atmosphere environment (glove box) for studies in controlled atmosphere environment.
Miscellaneous
- Three-zone furnace for single crystal growth
- Electrochemistry setup
- RF annealing station with controlled gas flow atmosphere
- RF network analyzer
- 9T variable temperature cryostat (base temperature 1.8K)
- Auxiliary equipment (optical microscopes, probe station, etc)
User Facilites
Philadelphia region has highly developed academic and research infrastructure. This is a sample list of user facilities that our group utilizes on a regular basis:
- Drexel University Core Facilites
- Singh Center for Nanotechnology (UPenn)
- Drexel Nanomaterials Institute
- Center for Materials Theory (Temple U)
- Temple Materials Institute (Temple U)
